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Fault localization and repair for Java runtime exceptions

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Year: 2009
Type: conference-paper
Source: ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA)
DOI: 10.1145/1572272.1572291
Authors: Saurabh Sinha, Hina Shah, Carsten Görg, Shujuan Jiang, Mijung Kim, Mary Jean Harrold
Institutions: IBM Research - India, IBM (India), Georgia Institute of Technology, China University of Mining and Technology
Language: English

Topic: Software Testing and Debugging Techniques
Subfield: Software
Field: Computer Science
Domain: Physical Sciences

Open Access status: closed
OpenAlex ID: W2039127983
FWCI: 1.971
Cites: 18
Cited by: 54
Related to: 10
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