Work

Negative-U Properties for Point Defects in Silicon

Year: 1980

Type: article

Source: Physical Review Letters

DOI: 10.1103/physrevlett.44.593

Authors: G. D. Watkins, J. R. Troxell

Institution: Lehigh University

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2039445163

FWCI: 12.49

Cites: 8

Cited by: 336

Related to: 10