Work

Exponential diffusion profile for impurity trapping at an unsaturable trap

Year: 1990

Type: article

Source: Physical review. B, Condensed matter

DOI: 10.1103/physrevb.42.11881

Authors: D. A. Tulchinsky, J. W. Corbett, J. T. Borenstein, S. J. Pearton

Institutions: University at Albany, State University of New York, AT&T (United States)

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2039462193

FWCI: 1.104

Cites: 11

Cited by: 16

Related to: 10