The testing effect in recognition memory: A dual process account.
Year: 2007
Type: article
Authors: Jason C. K. Chan, Kathleen B. McDermott
Institution: Washington University in St. Louis
Language: English
Subfield: Cognitive Neuroscience
Field: Neuroscience
Domain: Life Sciences
Open Access status: closed
Funder: James S. McDonnell Foundation
Award: G7429463717
OpenAlex ID: W2040065186