Work

Nanoscale Fourier-Transform Imaging with Magnetic Resonance Force Microscopy

Year: 2003

Type: article

Source: Physical Review Letters

DOI: 10.1103/physrevlett.90.087601

Authors: J. G. Kempf, J. A. Marohn

Institution: Cornell University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2040319953

FWCI: 2.316

Cites: 13

Cited by: 26

Related to: 10