Work

Optimizing two-pass connected-component labeling algorithms

Year: 2008

Type: article

Source: Pattern Analysis and Applications

DOI: 10.1007/s10044-008-0109-y

Authors: Kesheng Wu, Ekow Otoo, Kenji Suzuki

Institutions: Lawrence Berkeley National Laboratory, University of California, Berkeley, University of Chicago

Language: English

Topic: Digital Image Processing Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2040582952

FWCI: 18.21

Cites: 47

Cited by: 293

Related to: 10