Work

Combining AFM and FRET for high resolution fluorescence microscopy

Year: 2001

Type: article

Source: Journal of Microscopy

DOI: 10.1046/j.1365-2818.2001.00857.x

Authors: S. A. Vickery, R. C. Dunn

Institution: University of Kansas

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2041024721

FWCI: 2.113

Cites: 15

Cited by: 42

Related to: 10