Work

Application and calibration of a quartz needle sensor for high resolution scanning force microscopy

Year: 1999

Type: article

Source: Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

DOI: 10.1116/1.590751

Authors: W. Clauss, J. Zhang, D. J. Bergeron, A. T. Johnson

Institution: University of Pennsylvania

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2041493181

FWCI: 2.692

Cites: 7

Cited by: 22

Related to: 10