Intrinsic dead layer effect and the performance of ferroelectric thin film capacitors
Year: 1997
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.366147
Authors: C. Zhou, D. M. Newns
Institution: IBM Research - Thomas J. Watson Research Center
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2042015084
