Work

Critical Points and Ultraviolet Reflectivity of Semiconductors

Year: 1962

Type: article

Source: Physical Review Letters

DOI: 10.1103/physrevlett.9.94

Authors: D. Brust, J. C. Phillips, F. Bassani

Institution: University of Chicago

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2043249387

FWCI: 17.78

Cites: 13

Cited by: 232

Related to: 10