X-ray diffractometry and high-resolution electron microscopy of neutron-irradiated SiC to a fluence of 1.9×1027 n/m2
Work
Year: 1998
Type: article
Source: Journal of Nuclear Materials
Institution Tokyo Institute of Technology
Cites: 21
Cited by: 59
Related to: 10
FWCI: 1.72
Citation percentile (by year/subfield): 95.02
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Sustainable Development Goal Clean water and sanitation
Open Access status: closed