The reliability of general vague fault-tree analysis on weapon systems fault diagnosis
Year: 2005
Type: article
Source: Soft Computing
Authors: J.-R. Chang, K.-H. Chang, S.-H. Liao, C.-H. Cheng
Institution: National Yunlin University of Science and Technology
Language: English
Topic: Risk and Safety Analysis
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W2043718531