Work

Emitter-base breakdown: Measurement and simulation

Year: 1992

Type: article

Source: Microelectronic Engineering

DOI: 10.1016/0167-9317(92)90524-u

Authors: W. Bergner, P. Packan, B. Seidl, H. Klose

Institution: Siemens (Germany)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2044880896

FWCI:

Cites: 3

Cited by: 1

Related to: 10