Work

Experimental Demonstration of an Interferometric Technique for Characterizing the Full Optical Behavior of Multi-Mode Power Detectors

Year: 2011

Type: article

Source: IEEE Transactions on Terahertz Science and Technology

DOI: 10.1109/tthz.2011.2177693

Authors: Christopher N. Thomas, Stafford Withington

Institution: University of Cambridge

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2045792934

FWCI: 0.891

Cites: 17

Cited by: 13

Related to: 10