In-situ long trace profiler for measurement of mirror profiles at third-generation synchrotron facilities (abstract)
Year: 1996
Type: article
Source: Review of Scientific Instruments
DOI: 10.1063/1.1147331
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2046736239
