Work

Measuring architectural vulnerability factors

Year: 2003

Type: article

Source: IEEE Micro

DOI: 10.1109/mm.2003.1261389

Authors: S.S. Mukherjee, C.T. Weaver, J. Emer, S.K. Reinhardt, T. Austin

Institutions: Intel (Malaysia), University of Michigan

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2047171058

FWCI: 0.993

Cites: 20

Cited by: 101

Related to: 10