Work

Atomic resolution composition analysis by scanning transmission electron microscopy high-angle annular dark-field imaging

Year: 2003

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.1592314

Authors: E. Carlino, S. Modesti, D. Furlanetto, M. Piccin, S. Rubini, A. Franciosi

Institution: AREA Science Park

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2047299409

FWCI: 2.753

Cites: 17

Cited by: 31

Related to: 10