Work

High speed atomic force microscopy enabled by a sample profile estimator

Year: 2013

Type: article

Abstract: In this paper, an estimation scheme for imaging in Atomic Force Microscopy (AFM) is presented which yields imaging rates well beyond the bandwidth of the vertical positioner and allows for high-speed AFM on a typical commercial instrument. The estimator can be applied to existing instruments with little to no hardware modification other than that needed to sample the cantilever signal. Experiments on a calibration sample as well as lambda DNA are performed to illustrate the effectiveness of this method. These show a greater than an order-of-magnitude improvement in the imaging rate.

Source: Applied Physics Letters

DOI: 10.1063/1.4808211

Authors: Peng Huang, Sean B. Andersson

Institution: Boston University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

Funders: University of Bristol, National Institutes of Health, National Institute of General Medical Sciences, National Center for Research Resources

Awards: A Novel SFM-based Method for Studying Single Molecule Dynamics, A Novel SFM-based Method for Studying Single Molecule Dynamics