Work

A New SPC Monitoring Method: The ARMA Chart

Year: 2000

Type: article

Source: Technometrics

DOI: 10.1080/00401706.2000.10485713

Authors: Wei Jiang, Kwok-Leung Tsui, William H. Woodall

Institutions: Hong Kong University of Science and Technology, Georgia Institute of Technology, Virginia Tech

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W2047653254

FWCI: 5.113

Cites: 23

Cited by: 165

Related to: 10