Characterization and optimization of scan speed for tapping-mode atomic force microscopy
Year: 2002
Type: article
Source: Review of Scientific Instruments
DOI: 10.1063/1.1488679
Institution: Stanford University
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W2047828308