Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films
Year: 2015
Type: article
Source: Review of Scientific Instruments
DOI: 10.1063/1.4907354
Authors: T. Favaloro, J.-H. Bahk, A. Shakouri
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2047905832
