Work

Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution

Year: 2002

Type: article

Source: International Journal of Quality & Reliability Management

DOI: 10.1108/02656710210434757

Authors: Lee‐Ing Tong, K.S. Chen, H.T. Chen

Institutions: National Yang Ming Chiao Tung University, National Chin-Yi University of Technology

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2048080993

FWCI: 0.535

Cites: 17

Cited by: 101

Related to: 10