Work

Absolute mass thickness determination of thin samples by X-ray fluorescence analysis

Year: 1998

Type: article

Source: Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

DOI: 10.1016/s0168-583x(98)00412-1

Authors: R.A. Barrea, S. Bengió, P.A. Derosa, R.T. Mainardi

Institution: Universidad Nacional de Córdoba

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Comisión Nacional de Energía Atómica, Gobierno de Argentina

OpenAlex ID: W2048270984

FWCI: 1.221

Cites: 9

Cited by: 19

Related to: 10