Work

A Dual Purpose Cost Based Quality Control System

Year: 1973

Type: article

Source: Technometrics

DOI: 10.1080/00401706.1973.10489018

Authors: J. W. Schmidt, R. E. Taylor

Institution: Virginia Tech

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2048936554

FWCI: 3.576

Cites: 10

Cited by: 11

Related to: 10