Work

Developing High Resolution Electrical Probing System Based on Atomic Force Microscopy

Year: 1997

Type: article

Source: Molecular crystals and liquid crystals science technology. Section A, Molecular crystals and liquid crystals/Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals

DOI: 10.1080/10587259708032256

Authors: Yong Chen, Lei Wang, Huixin He, Zhongfan Liu

Institution: Peking University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2050140362

FWCI: 0.5

Cites: 9

Cited by: 2

Related to: 10