Work

Fast scanning in AFM using non-raster sampling and time-optimal trajectories

Year: 2012

Type: conference-paper

Source: IEEE Conference on Decision and Control (CDC)

DOI: 10.1109/cdc.2012.6426849

Authors: Peng Huang, Sean B. Andersson

Institution: Boston University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2050156545

FWCI: 2.361

Cites: 28

Cited by: 7

Related to: 10