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Low-temperature low-pressure die attach with hybrid silver particle paste

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Year: 2011
Type: article
Source: Microelectronics Reliability
DOI: 10.1016/j.microrel.2011.07.088
Authors: K. Suganuma, S. Sakamoto, N. Kagami, D. Wakuda, K.-S. Kim, M. Nogi
Institutions: The Institute of Scientific and Industrial Research, The University of Osaka, The University of Osaka
Language: English

Topic: Electronic Packaging and Soldering Technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funder: Japan Society for the Promotion of Science
Award: Science of Hetero-Interface of Advanced Power Devises in Extreme Environments
OpenAlex ID: W2050870760
FWCI: 5.293
Cites: 22
Cited by: 288
Related to: 10
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