Work

Negative Field-Effect Mobility on (100) Si Surfaces

Year: 1966

Type: article

Source: Physical Review Letters

DOI: 10.1103/physrevlett.16.797

Authors: F. F. Fang, W. E. Howard

Institutions: IBM (United States), IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2051546608

FWCI: 5.932

Cites: 5

Cited by: 527

Related to: 10