Work

NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space

Year: 2007

Type: article

Abstract: Near Edge X-ray Absorption Fine Structure (NEXAFS) spectromicroscopy, resonant scattering and resonant reflectivity are specialized, synchrotron radiation based, soft X-ray characterization tools that provide moiety-specific contrast and either real-space imaging at ∼30 nm spatial resolution, or scattering signals which can be inverted to provide chemically sensitive information at an even higher spatial resolution (<5 nm). These X-ray techniques complement other real and reciprocal space characterization tools such as various microscopies and conventional electron, X-ray and neutron scattering. We provide an overview of these synchrotron based tools, describe their present state-of-the-art and discuss a number of applications to exemplify their unique aspects.

Source: Polymer

DOI: 10.1016/j.polymer.2007.10.030

Authors: Harald Ade, Adam P. Hitchcock

Institutions: North Carolina State University, Brockhouse Institute for Materials Research, McMaster University

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $3,980

OpenAlex ID: W2051868840

FWCI: 15.25

Cites: 190

Cited by: 289

Related to: 10