Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al
Year: 1999
Type: article
Source: Applied Optics
DOI: 10.1364/ao.38.003614
Institution: University of Virginia
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2052902194
