Year: 1996
Type: article
Abstract: The nonlinear (electric field-dependent) resistivity of the 2D electron system in silicon exhibits scaling as a function of electric field and electron density in both the metallic and insulating phases, providing further evidence for a true metal-insulator transition in this 2D system at $B\phantom{\rule{0ex}{0ex}}=\phantom{\rule{0ex}{0ex}}0$. Comparison with the temperature scaling yields separate determinations of the correlation length exponent, $\ensuremath{\nu}\ensuremath{\approx}1.5$, and the dynamical exponent, $z\ensuremath{\approx}0.8$, close to the theoretical value $z\phantom{\rule{0ex}{0ex}}=\phantom{\rule{0ex}{0ex}}1$.
Source: Physical Review Letters
Institutions: City College of New York, University of Oklahoma
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
Funder: U.S. Department of Energy
OpenAlex ID: W2052929762
