Work

THE APPLICATION OF TIME‐OF‐FLIGHT SECONDARY ION MASS SPECTROMETRY (ToF‐SIMS) TO THE CHARACTERIZATION OF OPAQUE ANCIENT GLASSES*

Year: 2009

Type: article

Source: Archaeometry

DOI: 10.1111/j.1475-4754.2008.00445.x

Authors: F. J. M. RUTTEN, D. BRIGGS, J. HENDERSON, M. J. ROE

Institution: University of Nottingham

Language: English

Topic: Cultural Heritage Materials Analysis

Subfield: Archeology

Field: Arts and Humanities

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2054464572

FWCI: 18.88

Cites: 22

Cited by: 15

Related to: 10