Work

Improved atomic force microscope cantilever performance by ion beam modification

Year: 2001

Type: article

Source: Review of Scientific Instruments

DOI: 10.1063/1.1405799

Authors: Alex R. Hodges, Konrad M. Bussmann, Jan H. Hoh

Institutions: Johns Hopkins University, Johns Hopkins Medicine, United States Naval Research Laboratory, Naval Research Laboratory Materials Science and Technology Division

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: National Institutes of Health

OpenAlex ID: W2055036730

FWCI: 1.409

Cites: 10

Cited by: 35

Related to: 10