Work

Technology mapping for hot-carrier reliability enhancement

Year: 1997

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.284706

Authors: Zhan Chen, Israel Koren

Institution: University of Massachusetts Amherst

Language: English

Topic: VLSI and FPGA Design Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2055458225

FWCI:

Cites: 25

Cited by: 7

Related to: 10