Work

Studies of Materials at the Nanometer Scale Using Coherent X-Ray Diffraction Imaging

Year: 2013

Type: article

Source: JOM

DOI: 10.1007/s11837-013-0699-8

Authors: Richard L. Sandberg, Zhifeng Huang, Rui Xu, Jose A. Rodriguez, Jianwei Miao

Institutions: Los Alamos National Laboratory, Center for Integrated Nanotechnologies, California NanoSystems Institute, University of California, Los Angeles, University of California System, Howard Hughes Medical Institute

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2055783427

FWCI: 1.983

Cites: 168

Cited by: 11

Related to: 10