Work

Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever

Year: 2004

Type: article

Abstract: We propose a method for mapping the composition of a surface by using an amplitude modulation atomic force microscope operated without tip-surface mechanical contact. The method consists in exciting the first two modes of the microcantilever. The nonlinear dynamics of the tip motion, the coupling of its first two modes, and the sensitivity of the second mode to long-range attractive forces allows us to use this mode to probe compositional changes while the signal from the first mode is used to image the sample surface. We demonstrate that the second mode has a sensitivity to surface force variations below 10−11 N.

Source: Applied Physics Letters

DOI: 10.1063/1.1642273

Authors: Tomás R. Rodrı́guez, Ricardo Garcı́a

Institutions: Consejo Superior de Investigaciones Científicas, Institute of Micro and Nanotechnology

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2055840666

FWCI: 4.919

Cites: 27

Cited by: 292

Related to: 10