New measurement system for fault location in optical waveguide devices based on an interferometric technique
Year: 1987
Type: article
Source: Applied Optics
DOI: 10.1364/ao.26.001603
Institution: NTT (Japan)
Language: English
Topic: Advanced Fiber Optic Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2056433442
