Work

Measuring process capability based on CPK with gauge measurement errors

Year: 2004

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2004.09.005

Authors: W.L. Pearn, Mou-Yuan Liao

Institution: National Yang Ming Chiao Tung University

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2056837656

FWCI: 1.273

Cites: 16

Cited by: 47

Related to: 10