Work

Mismatch analysis of TAB-on-glass connection with ACF

Year: 2000

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.389411

Authors: Wei-Fun Hou, TaiYan Kam, Adam Hsieh, JianCheng Chen, Shyh-Ming Chang

Institutions: National Yang Ming Chiao Tung University, Industrial Technology Research Institute

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2056900570

FWCI:

Cites:

Cited by: 2

Related to: 10