Work

Cantilever microscanners for free-space optical interconnects

Year: 2002

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.469569

Authors: Bai Xu, Natalya Tokranova, James Castracane, Dong Yan

Institution: University at Albany, State University of New York

Language: English

Topic: Advanced MEMS and NEMS Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Defense Advanced Research Projects Agency

OpenAlex ID: W2057004013

FWCI: 0.711

Cites:

Cited by: 2

Related to: 10