Johnson-noise thermometry based on a quantized-voltage noise source at NIST
Year: 2013
Type: conference-paper
Source: AIP conference proceedings
DOI: 10.1063/1.4821368
Institution: National Institute of Standards and Technology
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W2057093047