Work

Temporal-noise measurements of a CMOS camera used for image quality measurements

Year: 2008

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.773602

Authors: Hans Roehrig, William J. Dallas, Gary R. Redford

Institution: University of Arizona

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2058473584

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