Raman Imaging Characterization of Electric Properties of SiC Near a Micropipe
Year: 2000
Type: article
Source: Materials science forum
Authors: Hiroshi Harima, Toru Hosoda, Shinichi Nakashima
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
OpenAlex ID: W2059492087