Dynamic behavior of the buildup of fixed charge and interface states during hot-carrier injection in encapsulated MOSFET's
Year: 1983
Type: article
Authors: W.G. Meyer, R.B. Fair
Institutions: AT&T (United States), MCNC Research and Development Institute
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2059704450