Work

On the Doping Dependence of Oxidation‐Induced Stacking Fault Shrinkage in Silicon

Year: 1982

Type: article

Source: Journal of The Electrochemical Society

DOI: 10.1149/1.2123502

Authors: R. B. Fair, A. Carim

Institutions: MCNC Research and Development Institute, Massachusetts Institute of Technology

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2060824683

FWCI: 3.271

Cites:

Cited by: 10

Related to: 10