Work

Image upsampling via imposed edge statistics

Year: 2007

Type: conference-paper

Source: ACM SIGGRAPH Conference (SIGGRAPH)

DOI: 10.1145/1275808.1276496

Author: Raanan Fattal

Institution: University of California, Berkeley

Language: English

Topic: Advanced Image Processing Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2061398022

FWCI: 11.26

Cites: 29

Cited by: 422

Related to: 10