Some Remarks on the Bayesian Solution of the Single Sample Inspection Scheme
Year: 1960
Type: article
Source: Technometrics
Author: G. B. Wetherill
Institutions: University of London, Birkbeck, University of London
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W2061478091