Work

The structure and properties of metal-semiconductor interfaces

Year: 1982

Type: article

Source: Surface Science Reports

DOI: 10.1016/0167-5729(82)90001-2

Author: L BRILLSON

Institution: Xerox (United States)

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2061700313

FWCI: 31.57

Cites: 506

Cited by: 932

Related to: 10