Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)
Year: 2005
Type: article
Source: Ultramicroscopy
Authors: A. Alexeev, J. Loos, M.M. Koetse
Institutions: Eindhoven University of Technology, Dutch Polymer Institute
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2061803385