Work

Chip-scale Atomic Devices: Precision Atomic Instruments Based on Mems

Year: 2009

Type: conference-paper

Source: Symposium on Frequency Standards and Metrology

DOI: 10.1142/9789812838223_0056

Authors: J. KITCHING, S. KNAPPE, V. GERGINOV, V. SHAH, P. D. D. SCHWINDT, B. LINDSETH, E. A. DONLEY, Y.-J. WANG, E. HODBY, M. EARDLEY, R. JIMENEZ, W. C. GRIFFITH, A. GERACI, J. PREUSSER, T. C. LIEBISCH, H. G. ROBINSON, L. HOLLBERG

Institutions: National Institute of Standards and Technology, Physikalisch-Technische Bundesanstalt, Federal Institute For Materials Research and Testing, Princeton University, Sandia National Laboratories, NSF National Center for Atmospheric Research, Stony Brook University

Language: English

Topic: Atomic and Subatomic Physics Research

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2061975768

FWCI: 3.116

Cites: 5

Cited by: 7

Related to: 10